Self-normalized yield of $\Upsilon$(nS) states as a function of self-normalized charged-particle multiplicity, $p_{\rm{T}}$-integrated. The vertical error bars represent the statistical uncertainty on the $\Upsilon$ yields, while the systematic uncertainties on $\textrm{d}N_{\mathrm{\Upsilon}}/\textrm{d}y/\langle \textrm{d}N_{\mathrm{\Upsilon}}/\textrm{d}y\rangle$ and $\textrm{d}N_{\mathrm{ch}} / \textrm{d}\eta$ / $\langle \textrm{d}N_{\mathrm{ch}}/\textrm{d}\eta \rangle$ are depicted as boxes. The dashed line shown in the top panel represents a linear function with the slope equal to unity.